Information card for entry 4341031

Structure parameters

• Formula: C32 H88 N4 O2 Se Si8 Y2
• Calculated formula: C32 H88 N4 O2 Se Si8 Y2
• SMILES: C[Si](C)(N([Y](N([Si](C)(C)C)[Si](C)(C)C)([O]1CCCC1)[Se][Y](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[O]1CCCC1)[Si](C)(C)C)C
• Title of publication: Cocrystallization of (μ-S2)(2-) and (μ-S)(2-) and Formation of an [η(2)-S3N(SiMe3)2] Ligand from Chalcogen Reduction by (N2)(2-) in a Bimetallic Yttrium Amide Complex.
• Authors of publication: Corbey, Jordan F.; Fang, Ming; Ziller, Joseph W.; Evans, William J.
• Journal of publication: Inorganic chemistry
• Year of publication: 2015
• Journal volume: 54
• Journal issue: 3
• Pages of publication: 801 - 807
• a: 10.4237 ± 0.0008 Å
• b: 12.1502 ± 0.001 Å
• c: 12.1856 ± 0.001 Å
• α: 61.9739 ± 0.0009°
• β: 88.8205 ± 0.001°
• γ: 80.5568 ± 0.001°
• Cell volume: 1341.03 ± 0.19 ų
• Cell temperature: 143 ± 2 K
• Ambient diffraction temperature: 143 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0329
• Residual factor for significantly intense reflections: 0.0279
• Weighted residual factors for significantly intense reflections: 0.0677
• Weighted residual factors for all reflections included in the refinement: 0.0699
• Goodness-of-fit parameter for all reflections included in the refinement: 1.045
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No