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Information card for entry 4341780
Preview
| Coordinates | 4341780.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H88 K N3 O7 S3 Si6 U |
|---|---|
| Calculated formula | C34 H88 K N3 O7 S3 Si6 U |
| SMILES | C[Si](C)(C)N([Si](C)(C)C)[U]12(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)S[S]2S1.C1C[O]2CC[O]3CC[O]4CC[O]5CC[O]6CC[O]1[K]23456.CCOCC |
| Title of publication | Reversible Chalcogen-Atom Transfer to a Terminal Uranium Sulfide. |
| Authors of publication | Smiles, Danil E.; Wu, Guang; Hayton, Trevor W. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2014 |
| Pages of publication | 141202142139009 |
| a | 11.2552 ± 0.0013 Å |
| b | 12.9335 ± 0.0015 Å |
| c | 20.934 ± 0.003 Å |
| α | 98.456 ± 0.002° |
| β | 96.945 ± 0.002° |
| γ | 110.308 ± 0.002° |
| Cell volume | 2777.9 ± 0.6 Å3 |
| Cell temperature | 105 ± 2 K |
| Ambient diffraction temperature | 105 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0397 |
| Residual factor for significantly intense reflections | 0.0345 |
| Weighted residual factors for significantly intense reflections | 0.0817 |
| Weighted residual factors for all reflections included in the refinement | 0.0853 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4341780.html
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Users of the data should acknowledge the original authors of the
structural data.