Information card for entry 4342435
| Formula |
C33 H45 P Te |
| Calculated formula |
C33 H45 P Te |
| SMILES |
[Te](c1ccc2c3c(ccc(P(C(C)C)C(C)C)c13)CC2)c1c(cc(cc1C(C)C)C(C)C)C(C)C |
| Title of publication |
Peri-Substituted Phosphorus-Tellurium Systems-An Experimental and Theoretical Investigation of the P···Te through-Space Interaction. |
| Authors of publication |
Nordheider, Andreas; Hupf, Emanuel; Chalmers, Brian A.; Knight, Fergus R.; Bühl, Michael; Mebs, Stefan; Chęcińska, Lilianna; Lork, Enno; Camacho, Paula Sanz; Ashbrook, Sharon E.; Athukorala Arachchige, Kasun S.; Cordes, David B.; Slawin, Alexandra M. Z.; Beckmann, Jens; Woollins, J. Derek |
| Journal of publication |
Inorganic chemistry |
| Year of publication |
2015 |
| Journal volume |
54 |
| Journal issue |
5 |
| Pages of publication |
2435 |
| a |
10.7116 ± 0.0014 Å |
| b |
26.482 ± 0.003 Å |
| c |
11.7583 ± 0.0015 Å |
| α |
90° |
| β |
116.705 ± 0.003° |
| γ |
90° |
| Cell volume |
2979.6 ± 0.6 Å3 |
| Cell temperature |
173 K |
| Ambient diffraction temperature |
173 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for significantly intense reflections |
0.0275 |
| Weighted residual factors for all reflections included in the refinement |
0.0707 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.043 |
| Diffraction radiation wavelength |
0.71075 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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