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Information card for entry 4342462
Preview
| Coordinates | 4342462.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C94 Cl21.67 |
|---|---|
| Calculated formula | C94 Cl21.666 |
| Title of publication | Five Isolated Pentagon Rule Isomers of Higher Fullerene C94 Captured as Chlorides and CF3 Derivatives: C94(34)Cl14, C94(61)Cl20, C94(133)Cl22, C94(42)(CF3)16, and C94(43)(CF3)18. |
| Authors of publication | Tamm, Nadezhda B.; Yang, Shangfeng; Wei, Tao; Troyanov, Sergey I. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2015 |
| Journal volume | 54 |
| Journal issue | 6 |
| Pages of publication | 2494 - 2496 |
| a | 35.685 ± 0.003 Å |
| b | 20.281 ± 0.001 Å |
| c | 21.358 ± 0.002 Å |
| α | 90° |
| β | 122.417 ± 0.009° |
| γ | 90° |
| Cell volume | 13049 ± 2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0691 |
| Residual factor for significantly intense reflections | 0.0476 |
| Weighted residual factors for significantly intense reflections | 0.116 |
| Weighted residual factors for all reflections included in the refinement | 0.1259 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.007 |
| Diffraction radiation wavelength | 0.88561 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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