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Information card for entry 4347116
Preview
| Coordinates | 4347116.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Nd4 O22 Si4 V4.53 Zn0.47 |
|---|---|
| Calculated formula | Nd4 O22 Si4 V4.533 Zn0.467 |
| Title of publication | New Lanthanide Mixed-Valent Vanadium(III/IV) Oxosilicates, Ln4V(5-x)Zn(x)Si4O22 (Ln = La, Ce, Pr, and Nd), Crystallizing in a Quasi Two-Dimensional Rutile-Based Structure. |
| Authors of publication | Abeysinghe, Dileka; Smith, Mark D.; Yeon, Jeongho; Morrison, Gregory; zur Loye, Hans-Conrad |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 4 |
| Pages of publication | 1821 - 1830 |
| a | 13.3232 ± 0.0007 Å |
| b | 5.6016 ± 0.0003 Å |
| c | 21.9856 ± 0.0015 Å |
| α | 90° |
| β | 100.651 ± 0.0017° |
| γ | 90° |
| Cell volume | 1612.55 ± 0.16 Å3 |
| Cell temperature | 301 ± 2 K |
| Ambient diffraction temperature | 301 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | I 1 2/a 1 |
| Hall space group symbol | -I 2ya |
| Residual factor for all reflections | 0.0306 |
| Residual factor for significantly intense reflections | 0.0214 |
| Weighted residual factors for significantly intense reflections | 0.0355 |
| Weighted residual factors for all reflections included in the refinement | 0.0378 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.116 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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