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Information card for entry 4347162
Preview
| Coordinates | 4347162.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H56 Cl4 N8 S4 Ta4 |
|---|---|
| Calculated formula | C36 H56 Cl4 N8 S4 Ta4 |
| SMILES | C(C)(C)(C)N=[Ta]12([S]3[Ta]4(=NC(C)(C)C)([S]1[Ta]1(=NC(C)(C)C)([S]4[Ta]3(=NC(C)(C)C)([S]21)(Cl)[n]1ccccc1)(Cl)[n]1ccccc1)(Cl)[n]1ccccc1)(Cl)[n]1ccccc1 |
| Title of publication | Systematic Approach for the Construction of Niobium and Tantalum Sulfide Clusters. |
| Authors of publication | Gómez, Manuel; Hernández-Prieto, Cristina; Martín, Avelino; Mena, Miguel; Santamaría, Cristina |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 8 |
| Pages of publication | 3815 - 3821 |
| a | 17.542 ± 0.004 Å |
| b | 17.542 ± 0.003 Å |
| c | 23.549 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7247 ± 2 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 88 |
| Hermann-Mauguin space group symbol | I 41/a :2 |
| Hall space group symbol | -I 4ad |
| Residual factor for all reflections | 0.0818 |
| Residual factor for significantly intense reflections | 0.0458 |
| Weighted residual factors for significantly intense reflections | 0.0965 |
| Weighted residual factors for all reflections included in the refinement | 0.1306 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.167 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4347162.html
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Users of the data should acknowledge the original authors of the
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