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Information card for entry 4347292
Preview
| Coordinates | 4347292.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C74 H86 Ga N2 Ni |
|---|---|
| Calculated formula | C74 H86 Ga N2 Ni |
| Title of publication | [Cp(Ar)Ni{Ga(nacnac)}]: An Open-Shell Nickel(I) Complex Supported by a Gallium(I) Carbenoid (Cp(Ar) = C5(C6H4-4-Et)5, nacnac = HC[C(Me)N-(C6H3)-2,6-iPr2]2). |
| Authors of publication | Chakraborty, Uttam; Mühldorf, Bernd; van Velzen, Niels J. C.; de Bruin, Bas; Harder, Sjoerd; Wolf, Robert |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 6 |
| Pages of publication | 3075 - 3078 |
| a | 24.54658 ± 0.00018 Å |
| b | 11.25766 ± 0.00008 Å |
| c | 22.79169 ± 0.00015 Å |
| α | 90° |
| β | 98.946 ± 0.0007° |
| γ | 90° |
| Cell volume | 6221.57 ± 0.08 Å3 |
| Cell temperature | 124 ± 1 K |
| Ambient diffraction temperature | 124 ± 1 K |
| Number of distinct elements | 5 |
| Space group number | 13 |
| Hermann-Mauguin space group symbol | P 1 2/c 1 |
| Hall space group symbol | -P 2yc |
| Residual factor for all reflections | 0.0382 |
| Residual factor for significantly intense reflections | 0.033 |
| Weighted residual factors for significantly intense reflections | 0.0818 |
| Weighted residual factors for all reflections included in the refinement | 0.086 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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