Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4347306
Preview
| Coordinates | 4347306.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C45 H44 O P2 Pd |
|---|---|
| Calculated formula | C45 H44 O P2 Pd |
| SMILES | [Pd]1([P](c2ccccc2c2ccccc2)(C)C)([P](c2c(cccc2)c2ccccc2)(C)C)[CH](=[CH]1C(=O)/C=C/c1ccccc1)c1ccccc1 |
| Title of publication | Steric and Electronic Influences of Buchwald-Type Alkyl-JohnPhos Ligands. |
| Authors of publication | Kendall, Alexander J.; Zakharov, Lev N.; Tyler, David R. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 6 |
| Pages of publication | 3079 - 3090 |
| a | 11.118 ± 0.0006 Å |
| b | 11.4477 ± 0.0006 Å |
| c | 15.4317 ± 0.0009 Å |
| α | 81.426 ± 0.002° |
| β | 78.935 ± 0.002° |
| γ | 79.538 ± 0.002° |
| Cell volume | 1882.2 ± 0.18 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0889 |
| Residual factor for significantly intense reflections | 0.07 |
| Weighted residual factors for significantly intense reflections | 0.1649 |
| Weighted residual factors for all reflections included in the refinement | 0.1755 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4347306.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.