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Information card for entry 4347867
Preview
| Coordinates | 4347867.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Ytterbium(II)amide |
|---|---|
| Formula | H4 N2 Yb |
| Calculated formula | H4 N2 Yb |
| Title of publication | Ammonothermal Synthesis, Crystal Structure, and Properties of the Ytterbium(II) and Ytterbium(III) Amides and the First Two Rare-Earth-Metal Guanidinates, YbC(NH)3 and Yb(CN3H4)3. |
| Authors of publication | Görne, Arno L; George, Janine; van Leusen, Jan; Dück, Gerald; Jacobs, Philipp; Chogondahalli Muniraju, Naveen Kumar; Dronskowski, Richard |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 12 |
| Pages of publication | 6161 - 6168 |
| a | 5.19598 ± 0.00013 Å |
| b | 5.19598 ± 0.00013 Å |
| c | 10.4129 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 281.13 ± 0.015 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 141 |
| Hermann-Mauguin space group symbol | I 41/a m d :1 |
| Hall space group symbol | I 4bw 2bw -1bw |
| Residual factor for all reflections | 0.0453 |
| Residual factor for significantly intense reflections | 0.0453 |
| Weighted residual factors for all reflections | 0.0481 |
| Weighted residual factors for significantly intense reflections | 0.0481 |
| Goodness-of-fit parameter for all reflections | 1.02 |
| Method of determination | powder diffraction |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.5406 Å |
| Diffraction radiation type | CuKα1 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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