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Information card for entry 4348009
Preview
| Coordinates | 4348009.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C19 H44 Cs N2 Na Si4 |
|---|---|
| Calculated formula | C19 H44 Cs0.989 N2 Na Si4 |
| SMILES | C[Si](C)(C)[N]1([Cs][N]([Si](C)(C)C)([Si](C)(C)C)[Na]1)[Si](C)(C)C.c1(ccccc1)C |
| Title of publication | Structural Studies of Cesium, Lithium/Cesium, and Sodium/Cesium Bis(trimethylsilyl)amide (HMDS) Complexes. |
| Authors of publication | Ojeda-Amador, Ana I; Martínez-Martínez, Antonio J; Kennedy, Alan R.; O'Hara, Charles T |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 11 |
| Pages of publication | 5719 - 5728 |
| a | 11.4391 ± 0.0006 Å |
| b | 11.6765 ± 0.0006 Å |
| c | 12.9108 ± 0.0005 Å |
| α | 106.202 ± 0.004° |
| β | 93.447 ± 0.004° |
| γ | 114.11 ± 0.005° |
| Cell volume | 1481.41 ± 0.15 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0437 |
| Residual factor for significantly intense reflections | 0.0378 |
| Weighted residual factors for significantly intense reflections | 0.0962 |
| Weighted residual factors for all reflections included in the refinement | 0.1 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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