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Information card for entry 4350289
Preview
| Coordinates | 4350289.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H20 Cl Cu N5 O5 S |
|---|---|
| Calculated formula | C24 H20 Cl Cu N5 O5 S |
| SMILES | [Cu]123([S](CC[N]2=Cc2c(O1)cccc2)C)[n]1cccc2c4nccnc4c4ccc[n]3c4c12.Cl(=O)(=O)(=O)[O-] |
| Title of publication | DNA cleavage on photoexposure at the d-d band in ternary copper(II) complexes using red-light laser. |
| Authors of publication | Dhar, Shanta; Nethaji, Munirathinam; Chakravarty, Akhil R. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2006 |
| Journal volume | 45 |
| Journal issue | 26 |
| Pages of publication | 11043 - 11050 |
| a | 12.209 ± 0.007 Å |
| b | 13.737 ± 0.008 Å |
| c | 14.884 ± 0.009 Å |
| α | 79.304 ± 0.011° |
| β | 83.491 ± 0.011° |
| γ | 89.745 ± 0.012° |
| Cell volume | 2437 ± 2 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1419 |
| Residual factor for significantly intense reflections | 0.0909 |
| Weighted residual factors for significantly intense reflections | 0.1733 |
| Weighted residual factors for all reflections included in the refinement | 0.1941 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.133 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4350289.html
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