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Information card for entry 4350419
Preview
| Coordinates | 4350419.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C9 H9 Ni S2 Se2 |
|---|---|
| Calculated formula | C9 H9 Ni S2 Se2 |
| SMILES | [Se]1C2S[Ni]3456(SC=2[Se]CC1)[cH]1[cH]3[cH]4[cH]5[cH]61 |
| Title of publication | [CpNi(dithiolene)] (and diselenolene) neutral radical complexes. |
| Authors of publication | Nomura, Mitsushiro; Cauchy, Thomas; Geoffroy, Michel; Adkine, Prashant; Fourmigué, Marc |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2006 |
| Journal volume | 45 |
| Journal issue | 20 |
| Pages of publication | 8194 - 8204 |
| a | 6.2605 ± 0.0005 Å |
| b | 21.146 ± 0.002 Å |
| c | 9.2234 ± 0.0007 Å |
| α | 90° |
| β | 106.276 ± 0.009° |
| γ | 90° |
| Cell volume | 1172.1 ± 0.18 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0862 |
| Residual factor for significantly intense reflections | 0.0619 |
| Weighted residual factors for significantly intense reflections | 0.1528 |
| Weighted residual factors for all reflections included in the refinement | 0.1761 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.975 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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