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Information card for entry 4350699
Preview
| Coordinates | 4350699.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C39 H72 Co N4 Si4 |
|---|---|
| Calculated formula | C39 H72 Co N4 Si4 |
| SMILES | [Co](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Carbene rearrangements in three-coordinate N-heterocyclic carbene complexes of cobalt(II) bis(trimethylsilyl)amide. |
| Authors of publication | Day, Benjamin M.; Pal, Kuntal; Pugh, Thomas; Tuck, Jessica; Layfield, Richard A. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2014 |
| Journal volume | 53 |
| Journal issue | 19 |
| Pages of publication | 10578 - 10584 |
| a | 11.2259 ± 0.0007 Å |
| b | 11.7912 ± 0.0007 Å |
| c | 19.1815 ± 0.0012 Å |
| α | 83.94 ± 0.005° |
| β | 80.051 ± 0.005° |
| γ | 63.371 ± 0.006° |
| Cell volume | 2234.4 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0754 |
| Residual factor for significantly intense reflections | 0.0554 |
| Weighted residual factors for significantly intense reflections | 0.1163 |
| Weighted residual factors for all reflections included in the refinement | 0.1309 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.081 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4350699.html
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Users of the data should acknowledge the original authors of the
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