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Information card for entry 4500083
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| Coordinates | 4500083.cif |
|---|
| Common name | tetrakis(4-hydroxyphenyl)silane - water clathrate |
|---|---|
| Formula | C24 H22 O5 Si |
| Calculated formula | C24 H22 O5 Si |
| SMILES | [Si](c1ccc(cc1)O)(c1ccc(cc1)O)(c1ccc(cc1)O)c1ccc(cc1)O.O |
| Title of publication | Molecular Tectonics. Hydrogen-Bonded Networks Built from Tetraphenols Derived from Tetraphenylmethane and Tetraphenylsilane |
| Authors of publication | Jean-Hugues Fournier; Thierry Maris; Michel Simard; James D. Wuest |
| Journal of publication | Cryst. Growth & Design |
| Year of publication | 2003 |
| Journal volume | 2 |
| Pages of publication | 535 - 540 |
| a | 14.962 ± 0.009 Å |
| b | 15.855 ± 0.011 Å |
| c | 19.697 ± 0.013 Å |
| α | 90° |
| β | 111.49 ± 0.05° |
| γ | 90° |
| Cell volume | 4348 ± 5 Å3 |
| Cell temperature | 210 ± 2 K |
| Ambient diffraction temperature | 210 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.121 |
| Residual factor for significantly intense reflections | 0.0784 |
| Weighted residual factors for significantly intense reflections | 0.1879 |
| Weighted residual factors for all reflections included in the refinement | 0.2049 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.064 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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