Information card for entry 4502818
| Common name |
1F |
| Chemical name |
1,3,5-triethyl-2,4,6-tris(4-fluorophenoxy)methylbenzene |
| Formula |
C33 H33 F3 O3 |
| Calculated formula |
C33 H33 F3 O3 |
| SMILES |
O(Cc1c(c(c(c(c1CC)COc1ccc(F)cc1)CC)COc1ccc(F)cc1)CC)c1ccc(F)cc1 |
| Title of publication |
Isostructurality in the Guest Free Forms and in the Clathrates of 1,3,5-Triethyl-2,4,6-tris(4-halophenoxy)methylbenzenes |
| Authors of publication |
Bhattacharya, Suman; Saha, Binoy K. |
| Journal of publication |
Crystal Growth & Design |
| Year of publication |
2012 |
| Journal volume |
12 |
| Journal issue |
1 |
| Pages of publication |
169 |
| a |
10.757 ± 0.005 Å |
| b |
18.021 ± 0.007 Å |
| c |
14.908 ± 0.005 Å |
| α |
90° |
| β |
104.84 ± 0.04° |
| γ |
90° |
| Cell volume |
2794 ± 2 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.4421 |
| Residual factor for significantly intense reflections |
0.0885 |
| Weighted residual factors for significantly intense reflections |
0.0683 |
| Weighted residual factors for all reflections included in the refinement |
0.1154 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.774 |
| Diffraction radiation wavelength |
0.7107 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4502818.html