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Information card for entry 4502822
Preview
| Coordinates | 4502822.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 1F, p-xylene |
|---|---|
| Chemical name | 1,3,5-triethyl-2,4,6-tris(4-fluorophenoxy)methylbenzene, p-xylene |
| Formula | C49 H53 F3 O3 |
| Calculated formula | C41 H43 F3 O3 |
| SMILES | O(c1ccc(F)cc1)Cc1c(c(c(c(c1CC)COc1ccc(F)cc1)CC)COc1ccc(F)cc1)CC.c1(ccccc1C)C |
| Title of publication | Isostructurality in the Guest Free Forms and in the Clathrates of 1,3,5-Triethyl-2,4,6-tris(4-halophenoxy)methylbenzenes |
| Authors of publication | Bhattacharya, Suman; Saha, Binoy K. |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2012 |
| Journal volume | 12 |
| Journal issue | 1 |
| Pages of publication | 169 |
| a | 10.6739 ± 0.0016 Å |
| b | 14.39 ± 0.002 Å |
| c | 15.89 ± 0.002 Å |
| α | 69.666 ± 0.014° |
| β | 71.915 ± 0.013° |
| γ | 77.992 ± 0.013° |
| Cell volume | 2161.7 ± 0.6 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1667 |
| Residual factor for significantly intense reflections | 0.0988 |
| Weighted residual factors for significantly intense reflections | 0.2846 |
| Weighted residual factors for all reflections included in the refinement | 0.3474 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.992 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4502822.html
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Users of the data should acknowledge the original authors of the
structural data.