Information card for entry 4505025
| Common name |
2,3,6,7,10,11-Hexakis(methylthio)triphenylene |
| Formula |
C24 H24 S6 |
| Calculated formula |
C24 H24 S6 |
| SMILES |
S(C)c1cc2c3cc(SC)c(SC)cc3c3cc(SC)c(SC)cc3c2cc1SC |
| Title of publication |
A Semiconductive Coordination Network Based on 2,3,6,7,10,11-Hexakis(methylthio)triphenylene and BiCl3 |
| Authors of publication |
Xu, Zhengtao; Li, Kunhao; Fettinger, James C.; Li, Jing; King, Michael M. |
| Journal of publication |
Crystal Growth & Design |
| Year of publication |
2005 |
| Journal volume |
5 |
| Journal issue |
2 |
| Pages of publication |
423 |
| a |
7.5608 ± 0.0004 Å |
| b |
13.0954 ± 0.0007 Å |
| c |
13.7926 ± 0.0007 Å |
| α |
115.964 ± 0.001° |
| β |
96.603 ± 0.001° |
| γ |
100.919 ± 0.001° |
| Cell volume |
1174.88 ± 0.11 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0546 |
| Residual factor for significantly intense reflections |
0.0452 |
| Weighted residual factors for significantly intense reflections |
0.1202 |
| Weighted residual factors for all reflections included in the refinement |
0.1265 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.049 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4505025.html