Information card for entry 4506205

Structure parameters

• Formula: C78 H84 Ag4 N34 O22
• Calculated formula: C78 H84 Ag4 N34 O22
• SMILES: CO[N](=c1c2c(nc[nH]1)n(cn2)Cc1ccccc1)[Ag][N](=c1c2c(nc[nH]1)n(cn2)Cc1ccccc1)OC.CO[N](=c1c2c(nc[nH]1)n(cn2)Cc1ccccc1)[Ag][N](=c1c2c(nc[nH]1)n(cn2)Cc1ccccc1)OC.CO[N]1=c2c3c(nc[nH]2)n(c[n]3[Ag]2[N](=c3c4c(nc[nH]3)n(c[n]4[Ag]12)Cc1ccccc1)OC)Cc1ccccc1.N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].N(=O)(=O)[O-].O.O.O.O
• Title of publication: Crystallographic Signatures ofN6-Methoxyadenine Imino Tautomer‒Silver Complexes
• Authors of publication: Khanna, Shruti; Verma, Sandeep
• Journal of publication: Crystal Growth & Design
• Year of publication: 2012
• Journal volume: 12
• Journal issue: 6
• Pages of publication: 3025
• a: 22.321 ± 0.004 Å
• b: 12.638 ± 0.003 Å
• c: 31.194 ± 0.004 Å
• α: 90°
• β: 95.07 ± 0.04°
• γ: 90°
• Cell volume: 8765 ± 3 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0935
• Residual factor for significantly intense reflections: 0.0589
• Weighted residual factors for significantly intense reflections: 0.1293
• Weighted residual factors for all reflections included in the refinement: 0.151
• Goodness-of-fit parameter for all reflections included in the refinement: 1.022
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No