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Information card for entry 4506613
Preview
| Coordinates | 4506613.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | HMX - thieno[3,2-b]thiophene |
|---|---|
| Chemical name | 1,3,5,7-tetranitro-1,3,5,7-tetraza-cyclooctane - thieno[3,2-b]thiophene |
| Formula | C10 H12 N8 O8 S2 |
| Calculated formula | C10 H12 N8 O8 S2 |
| SMILES | C1N(N(=O)=O)CN(CN(CN1N(=O)=O)N(=O)=O)N(=O)=O.c1cc2c(s1)ccs2 |
| Title of publication | Cocrystals of 1,3,5,7-Tetranitro-1,3,5,7-tetrazacyclooctane (HMX) |
| Authors of publication | Landenberger, Kira B.; Matzger, Adam J. |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2012 |
| Journal volume | 12 |
| Journal issue | 7 |
| Pages of publication | 3603 |
| a | 11.1402 ± 0.0005 Å |
| b | 19.1745 ± 0.0014 Å |
| c | 7.6902 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1642.69 ± 0.15 Å3 |
| Cell temperature | 95 ± 2 K |
| Ambient diffraction temperature | 95 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.0376 |
| Residual factor for significantly intense reflections | 0.0356 |
| Weighted residual factors for significantly intense reflections | 0.0977 |
| Weighted residual factors for all reflections included in the refinement | 0.1012 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.096 |
| Diffraction radiation wavelength | 1.54187 Å |
| Diffraction radiation type | CuKα |
| Duplicate of | 4506301 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.