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Information card for entry 4507559
Preview
| Coordinates | 4507559.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 4-fluorotoluene |
|---|---|
| Formula | C7 H7 F |
| Calculated formula | C7 H7 F |
| SMILES | Fc1ccc(cc1)C |
| Title of publication | High-Pressure and Low-Temperature Polymorphism in C‒H···F‒C Hydrogen Bonded Monofluorotoluenes |
| Authors of publication | Ridout, Joe; Probert, Michael R. |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2013 |
| Journal volume | 13 |
| Journal issue | 5 |
| Pages of publication | 1943 |
| a | 13.215 ± 0.004 Å |
| b | 4.7872 ± 0.0008 Å |
| c | 8.9622 ± 0.0019 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 567 ± 0.2 Å3 |
| Cell temperature | 293.15 K |
| Ambient diffraction temperature | 293.15 K |
| Number of distinct elements | 3 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0923 |
| Residual factor for significantly intense reflections | 0.0499 |
| Weighted residual factors for significantly intense reflections | 0.1296 |
| Weighted residual factors for all reflections included in the refinement | 0.1692 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.56087 Å |
| Diffraction radiation type | AgKα |
| Diffraction radiation X-ray symbol | K-L~3~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4507559.html
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Users of the data should acknowledge the original authors of the
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