Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4508357
Preview
| Coordinates | 4508357.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H10 S2 |
|---|---|
| Calculated formula | C18 H10 S2 |
| Title of publication | syn-/anti-Anthradithiophene Derivative Isomer Effects on Semiconducting Properties. |
| Authors of publication | Mamada, Masashi; Katagiri, Hiroshi; Mizukami, Makoto; Honda, Kota; Minamiki, Tsukuru; Teraoka, Ryo; Uemura, Taisuke; Tokito, Shizuo |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2013 |
| Journal volume | 5 |
| Journal issue | 19 |
| Pages of publication | 9670 - 9677 |
| a | 5.8865 ± 0.0008 Å |
| b | 7.5079 ± 0.001 Å |
| c | 14.347 ± 0.002 Å |
| α | 96.106 ± 0.004° |
| β | 94.285 ± 0.004° |
| γ | 90.414 ± 0.004° |
| Cell volume | 628.64 ± 0.15 Å3 |
| Cell temperature | 113 K |
| Ambient diffraction temperature | 113 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1073 |
| Residual factor for significantly intense reflections | 0.0981 |
| Weighted residual factors for significantly intense reflections | 0.2374 |
| Weighted residual factors for all reflections included in the refinement | 0.2423 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.253 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4508357.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.