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Information card for entry 4508612
Preview
| Coordinates | 4508612.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 11199Z |
|---|---|
| Formula | C46 H30 F6 |
| Calculated formula | C46 H30 F6 |
| Title of publication | Utilizing Carbon Nanotube Electrodes to Improve Charge Injection and Transport in Bis(trifluoromethyl)-dimethyl-rubrene Ambipolar Single Crystal Transistors. |
| Authors of publication | Xie, Wei; Prabhumirashi, Pradyumna L.; Nakayama, Yasuo; McGarry, Kathryn A.; Geier, Michael L.; Uragami, Yuki; Mase, Kazuhiko; Douglas, Christopher J.; Ishii, Hisao; Hersam, Mark C.; Frisbie, C. Daniel |
| Journal of publication | ACS nano |
| Year of publication | 2013 |
| Journal volume | 7 |
| Journal issue | 11 |
| Pages of publication | 10245 - 10256 |
| a | 34.197 ± 0.006 Å |
| b | 7.1577 ± 0.0011 Å |
| c | 14.052 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3439.5 ± 0.9 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 64 |
| Hermann-Mauguin space group symbol | C m c a |
| Hall space group symbol | -C 2ac 2 |
| Residual factor for all reflections | 0.0915 |
| Residual factor for significantly intense reflections | 0.0527 |
| Weighted residual factors for significantly intense reflections | 0.1331 |
| Weighted residual factors for all reflections included in the refinement | 0.156 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.031 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.