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Information card for entry 4508739
Preview
| Coordinates | 4508739.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H18 Ag2 F8 O8 S4 |
|---|---|
| Calculated formula | C14 H18 Ag2 F8 O8 S4 |
| SMILES | [Ag]1[S](C)C[S]([Ag][S](C)C[S]1C)C.C(=O)(C(C(C(=O)[O-])(F)F)(F)F)O.C(=O)(C(C(C(=O)[O-])(F)F)(F)F)O |
| Title of publication | Influence of the Anion on the Structure of Bis(methylthio)methane Supramolecular Coordination Complexes |
| Authors of publication | Awaleh, Mohamed Osman; Badia, Antonella; Brisse, François |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2006 |
| Journal volume | 6 |
| Journal issue | 12 |
| Pages of publication | 2674 |
| a | 6.7508 ± 0.0002 Å |
| b | 8.3046 ± 0.0003 Å |
| c | 10.8924 ± 0.0004 Å |
| α | 87.794 ± 0.002° |
| β | 83.849 ± 0.002° |
| γ | 83.473 ± 0.002° |
| Cell volume | 602.99 ± 0.04 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0356 |
| Residual factor for significantly intense reflections | 0.0337 |
| Weighted residual factors for significantly intense reflections | 0.0919 |
| Weighted residual factors for all reflections included in the refinement | 0.0946 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.808 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4508739.html
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Users of the data should acknowledge the original authors of the
structural data.