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Information card for entry 4508850
Preview
| Coordinates | 4508850.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H20 Cl2 Pt Se2 |
|---|---|
| Calculated formula | C24 H20 Cl2 Pt Se2 |
| SMILES | [Pt]([Se](c1ccccc1)c1ccccc1)([Se](c1ccccc1)c1ccccc1)(Cl)Cl |
| Title of publication | Isomerism in [MCl2(ERR‘)2] (M = Pd, Pt; E = S, Se; R, R‘ = Me, Ph) |
| Authors of publication | Vigo, Ludmila; Risto, Maarit; Jahr, Esther M.; Bajorek, Tom; Oilunkaniemi, Raija; Laitinen, Risto S.; Lahtinen, Manu; Ahlgrén, Markku |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2006 |
| Journal volume | 6 |
| Journal issue | 10 |
| Pages of publication | 2376 |
| a | 12.387 ± 0.003 Å |
| b | 13.476 ± 0.003 Å |
| c | 13.778 ± 0.003 Å |
| α | 90° |
| β | 91.64 ± 0.03° |
| γ | 90° |
| Cell volume | 2299 ± 0.9 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0374 |
| Residual factor for significantly intense reflections | 0.0302 |
| Weighted residual factors for significantly intense reflections | 0.0862 |
| Weighted residual factors for all reflections included in the refinement | 0.1097 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.317 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4508850.html
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