Information card for entry 4509516
| Chemical name |
3,3',5,5'-Tetramethyl-4,4'-bipyrazolium Dithionate, Dihydrate |
| Formula |
C10 H20 N4 O8 S2 |
| Calculated formula |
C10 H20 N4 O8 S2 |
| SMILES |
S(=O)(=O)(S(=O)(=O)[O-])[O-].O.O.[nH]1[nH+]c(c(c1C)c1c([nH][nH+]c1C)C)C |
| Title of publication |
Hydrogen Bonding Patterns and Supramolecular Structure of 4,4′-Bipyrazolium Salts |
| Authors of publication |
Boldog, Ishtvan; Daran, Jean-Claude; Chernega, Alexander N.; Rusanov, Eduard B.; Krautscheid, Harald; Domasevitch, Konstantin V. |
| Journal of publication |
Crystal Growth & Design |
| Year of publication |
2009 |
| Journal volume |
9 |
| Journal issue |
6 |
| Pages of publication |
2895 |
| a |
10.936 ± 0.002 Å |
| b |
11.701 ± 0.002 Å |
| c |
14.855 ± 0.003 Å |
| α |
90° |
| β |
110.93 ± 0.03° |
| γ |
90° |
| Cell volume |
1775.5 ± 0.7 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0761 |
| Residual factor for significantly intense reflections |
0.0402 |
| Weighted residual factors for significantly intense reflections |
0.1137 |
| Weighted residual factors for all reflections included in the refinement |
0.1262 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.036 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4509516.html