Information card for entry 4510563
| Common name |
Hexaphenyldisilane |
| Chemical name |
Hexaphenyldisilane |
| Formula |
C36 H30 Si2 |
| Calculated formula |
C36 H30 Si2 |
| SMILES |
[Si](c1ccccc1)(c1ccccc1)(c1ccccc1)[Si](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication |
Determination of the Crystal Structure of Hexaphenyldisilane from Powder Diffraction Data and Its Thermodynamic Properties |
| Authors of publication |
Bernert, Thomas; Winkler, Björn; Krysiak, Yasar; Fink, Lothar; Berger, Matthias; Alig, Edith; Bayarjargal, Lkhamsuren; Milman, Victor; Ehm, Lars; Stephens, Peter W.; Auner, Norbert; Lerner, Hans-Wolfram |
| Journal of publication |
Crystal Growth & Design |
| Year of publication |
2014 |
| Journal volume |
14 |
| Journal issue |
6 |
| Pages of publication |
2937 |
| a |
20.2889 ± 0.0008 Å |
| b |
16.9602 ± 0.0007 Å |
| c |
8.5506 ± 0.0004 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2942.3 ± 0.2 Å3 |
| Cell temperature |
298 K |
| Ambient diffraction temperature |
298 K |
| Number of distinct elements |
3 |
| Space group number |
19 |
| Hermann-Mauguin space group symbol |
P 21 21 21 |
| Hall space group symbol |
P 2ac 2ab |
| Residual factor R(I) for significantly intense reflections |
1.505 |
| Goodness-of-fit parameter for all reflections |
2.233 |
| Method of determination |
powder diffraction |
| Diffraction radiation wavelength |
0.7 Å |
| Diffraction radiation type |
synchrotron |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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