Information card for entry 4511481

Structure parameters

• Formula: C33 H36 Ag3 Cl6 F18 N12 S6 Sb3
• Calculated formula: C33 H36 Ag3 Cl6 F18 N12 S6 Sb3
• SMILES: [Ag]123[N]([N]4[Ag]5([N]([N]6[Ag]7([n]8c(C=6C)scc8)[n]6ccsc6C(=[N]7[N]1=C(C)c1[n]2ccs1)C)=C(c1[n]5ccs1)C)[n]1ccsc1C=4C)=C(c1[n]3ccs1)C.C(Cl)Cl.C(Cl)Cl.C(Cl)Cl.F[Sb](F)(F)([F-])(F)F.F[Sb](F)(F)(F)(F)[F-].F[Sb](F)(F)(F)([F-])F
• Title of publication: Ag(I) Complexes Generated from Double Schiff-Base Ligand with Thiazole as the Terminal Binding Sites
• Authors of publication: Dong, Yu-Bin; Wang, Le; Ma, Jian-Ping; Zhao, Xia-Xia; Shen, Da-Zhong; Huang, Ru-Qi
• Journal of publication: Crystal Growth & Design
• Year of publication: 2006
• Journal volume: 6
• Journal issue: 11
• Pages of publication: 2475
• a: 17.353 ± 0.009 Å
• b: 20.233 ± 0.01 Å
• c: 18.235 ± 0.009 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 6402 ± 6 ų
• Cell temperature: 298 ± 2 K
• Ambient diffraction temperature: 298 ± 2 K
• Number of distinct elements: 8
• Space group number: 33
• Hermann-Mauguin space group symbol: P n a 21
• Hall space group symbol: P 2c -2n
• Residual factor for all reflections: 0.0768
• Residual factor for significantly intense reflections: 0.0578
• Weighted residual factors for significantly intense reflections: 0.131
• Weighted residual factors for all reflections included in the refinement: 0.1435
• Goodness-of-fit parameter for all reflections included in the refinement: 1.048
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No