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Information card for entry 4511998
Preview
| Coordinates | 4511998.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H20 Br6 N6 O2 Re |
|---|---|
| Calculated formula | C16 H20 Br6 N6 O2 Re |
| SMILES | C(OC)n1c2c(cccc2)[nH+]n1.Br[Re](Br)(Br)(Br)([Br-])[Br-].c12ccccc1n(COC)n[nH+]2 |
| Title of publication | Self-Assembly of the Hexabromorhenate(IV) Anion with Protonated Benzotriazoles: X-ray Structure and Magnetic Properties |
| Authors of publication | Martínez-Lillo, José; Kong, John; Julve, Miguel; Brechin, Euan K. |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2014 |
| Journal volume | 14 |
| Journal issue | 11 |
| Pages of publication | 5985 |
| a | 8.1914 ± 0.0003 Å |
| b | 8.8446 ± 0.0003 Å |
| c | 9.7565 ± 0.0003 Å |
| α | 69.846 ± 0.003° |
| β | 71.273 ± 0.003° |
| γ | 82.038 ± 0.003° |
| Cell volume | 628.13 ± 0.04 Å3 |
| Cell temperature | 120.01 ± 0.1 K |
| Ambient diffraction temperature | 120.01 ± 0.1 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0255 |
| Residual factor for significantly intense reflections | 0.0229 |
| Weighted residual factors for significantly intense reflections | 0.05 |
| Weighted residual factors for all reflections included in the refinement | 0.051 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.064 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4511998.html
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