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Information card for entry 4512674
Preview
| Coordinates | 4512674.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 H29 N3 O2 Pt |
|---|---|
| Calculated formula | C37 H29 N3 O2 Pt |
| SMILES | [Pt]12(c3c(c4[n]1cccc4)cccc3)[N](=Cc1c(O2)ccc(OC)c1)c1ccc(N(c2ccccc2)c2ccccc2)cc1 |
| Title of publication | Electropolymerized highly photoconductive thin films of cyclopalladated and cycloplatinated complexes. |
| Authors of publication | Ionescu, Andreea; Lento, Raffaella; Mastropietro, Teresa F.; Aiello, Iolinda; Termine, Roberto; Golemme, Attilio; Ghedini, Mauro; Bellec, Nathalie; Pini, Elena; Rimoldi, Isabella; Godbert, Nicolas |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2015 |
| Journal volume | 7 |
| Journal issue | 7 |
| Pages of publication | 4019 - 4028 |
| a | 28.23 ± 0.013 Å |
| b | 6.498 ± 0.003 Å |
| c | 16.353 ± 0.008 Å |
| α | 90° |
| β | 90.285 ± 0.016° |
| γ | 90° |
| Cell volume | 3000 ± 2 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0482 |
| Residual factor for significantly intense reflections | 0.0278 |
| Weighted residual factors for significantly intense reflections | 0.0688 |
| Weighted residual factors for all reflections included in the refinement | 0.1016 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.137 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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