Information card for entry 4513165
| Formula |
C31 H37 N O6 S |
| Calculated formula |
C31 H37 N O6 S |
| SMILES |
S(=O)(=O)([O-])c1ccc(cc1)C.[NH+]1(CCC(CC1)CC1Cc2cc(c(cc2C1=O)OC)OC)Cc1ccccc1 |
| Title of publication |
Sulfonic Acid Salts of Donepezil and Stabilization of Amorphous Donepezil via Formation of Amorphous Salts |
| Authors of publication |
Lee, Sun Hye; Bae, Jae Ho; Park, Yeojin; Adhikari, Bishal Raj; Mao, Chen; Kim, Daeyoung; Kim, Kyung Im; Kang, Sung Kwon; Lee, Eun Hee |
| Journal of publication |
Crystal Growth & Design |
| Year of publication |
2015 |
| Journal volume |
15 |
| Journal issue |
7 |
| Pages of publication |
3123 |
| a |
8.4004 ± 0.0013 Å |
| b |
12.2217 ± 0.0018 Å |
| c |
27.844 ± 0.004 Å |
| α |
90° |
| β |
92.11 ± 0.003° |
| γ |
90° |
| Cell volume |
2856.7 ± 0.7 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.1247 |
| Residual factor for significantly intense reflections |
0.0587 |
| Weighted residual factors for significantly intense reflections |
0.1269 |
| Weighted residual factors for all reflections included in the refinement |
0.1554 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.01 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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