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Information card for entry 4513177
Preview
| Coordinates | 4513177.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Bis trichloromethane tetrakis-(4-iodophenyl)ethylene |
|---|---|
| Formula | C28 H17 Cl6 I4 |
| Calculated formula | C28 H17 Cl6 I4 |
| Title of publication | Halogen Bonding in Host‒Guest Compounds: Structures and Kinetics of Enclathration and Desolvation |
| Authors of publication | Amombo Noa, Francoise M.; Bourne, Susan A.; Nassimbeni, Luigi R. |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2015 |
| Journal volume | 15 |
| Journal issue | 7 |
| Pages of publication | 3271 |
| a | 9.7376 ± 0.0019 Å |
| b | 15.325 ± 0.003 Å |
| c | 22.994 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3431.4 ± 1.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0658 |
| Residual factor for significantly intense reflections | 0.0427 |
| Weighted residual factors for significantly intense reflections | 0.1211 |
| Weighted residual factors for all reflections included in the refinement | 0.1714 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.083 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4513177.html
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