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Information card for entry 4513362
Preview
| Coordinates | 4513362.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | As4 He2 O6 |
|---|---|
| Calculated formula | As4 He2 O6 |
| Title of publication | Compressed Arsenolite As4O6and Its Helium Clathrate As4O6·2He |
| Authors of publication | Guńka, Piotr A.; Dziubek, Kamil F.; Gładysiak, Andrzej; Dranka, Maciej; Piechota, Jacek; Hanfland, Michael; Katrusiak, Andrzej; Zachara, Janusz |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2015 |
| Journal volume | 15 |
| Journal issue | 8 |
| Pages of publication | 3740 |
| a | 10.371 ± 0.002 Å |
| b | 10.371 ± 0.002 Å |
| c | 10.371 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1115.5 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Cell measurement pressure | 7710000 ± 80000 kPa |
| Ambient diffracton pressure | 7710000 ± 80000 kPa |
| Number of distinct elements | 3 |
| Space group number | 227 |
| Hermann-Mauguin space group symbol | F d -3 m |
| Hall space group symbol | -F 4vw 2vw 3 |
| Residual factor for all reflections | 0.1087 |
| Residual factor for significantly intense reflections | 0.0884 |
| Weighted residual factors for significantly intense reflections | 0.171 |
| Weighted residual factors for all reflections included in the refinement | 0.1826 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.164 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.41427 Å |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4513362.html
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