Crystallography Open Database

Information card for entry 4513579

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Structure parameters

Formula	As4 O6
Calculated formula	As4 O6
SMILES	O1[As]2O[As]3O[As]1O[As](O2)O3
Title of publication	Compressed Arsenolite As4O6and Its Helium Clathrate As4O6·2He
Authors of publication	Guńka, Piotr A.; Dziubek, Kamil F.; Gładysiak, Andrzej; Dranka, Maciej; Piechota, Jacek; Hanfland, Michael; Katrusiak, Andrzej; Zachara, Janusz
Journal of publication	Crystal Growth & Design
Year of publication	2015
Journal volume	15
Journal issue	8
Pages of publication	3740
a	9.7729 ± 0.0004 Å
b	9.7729 ± 0.0004 Å
c	9.7729 ± 0.0004 Å
α	90°
β	90°
γ	90°
Cell volume	933.41 ± 0.07 Å³
Cell temperature	293 ± 2 K
Ambient diffraction temperature	293 ± 2 K
Cell measurement pressure	17590000 ± 50000 kPa
Ambient diffracton pressure	17590000 ± 50000 kPa
Number of distinct elements	2
Space group number	227
Hermann-Mauguin space group symbol	F d -3 m :2
Hall space group symbol	-F 4vw 2vw 3
Residual factor for all reflections	0.0342
Residual factor for significantly intense reflections	0.0332
Weighted residual factors for significantly intense reflections	0.092
Weighted residual factors for all reflections included in the refinement	0.0933
Goodness-of-fit parameter for all reflections included in the refinement	1.31
Diffraction radiation probe	x-ray
Diffraction radiation wavelength	0.41427 Å
Has coordinates	Yes
Has disorder	No
Has F_obs	No

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