Information card for entry 4513787
| Common name |
1:1 theophylline N,N-dimethylformamide cocrystal |
| Chemical name |
1,3-dimethyl-7H-purine-2,6-dione N,N-dimethylformamide complex |
| Formula |
C10 H15 N5 O3 |
| Calculated formula |
C10 H15 N5 O3 |
| SMILES |
O=C1N(C(=O)N(c2nc[nH]c12)C)C.O=CN(C)C |
| Title of publication |
Investigation of an Amide-Pseudo Amide Hydrogen Bonding Motif within a Series of Theophylline:Amide Cocrystals |
| Authors of publication |
Eddleston, Mark D.; Arhangelskis, Mihails; Fábián, Laszlo; Tizzard, Graham J.; Coles, Simon J.; Jones, William |
| Journal of publication |
Crystal Growth & Design |
| Year of publication |
2015 |
| a |
4.4183 ± 0.0001 Å |
| b |
14.3872 ± 0.0006 Å |
| c |
19.3622 ± 0.0009 Å |
| α |
90° |
| β |
93.41 ± 0.03° |
| γ |
90° |
| Cell volume |
1228.62 ± 0.09 Å3 |
| Cell temperature |
250 ± 2 K |
| Ambient diffraction temperature |
250 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0889 |
| Residual factor for significantly intense reflections |
0.0545 |
| Weighted residual factors for significantly intense reflections |
0.1309 |
| Weighted residual factors for all reflections included in the refinement |
0.1504 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.079 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4513787.html