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Information card for entry 4514590
Preview
| Coordinates | 4514590.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Formula | C59 H37 N3 |
|---|---|
| Calculated formula | C59 H37 N3 |
| SMILES | n1(c2c(nc1c1cc(c3c4c(c(c5c3cccc5)c3cc(n5c6c(c7c5cccc7)cccc6)ccc3)cccc4)ccc1)c1ccccc1c1c2cccc1)c1ccccc1 |
| Title of publication | Efficient Deep-Blue Fluorescent OLEDs with a High Exciton Utilization Efficiency from a Fully Twisted Phenanthroimidazole-Anthracene Emitter. |
| Authors of publication | Xu, Yuwei; Liang, Xiaoming; Liang, Yiqian; Guo, Xiaomin; Hanif, Muddasir; Zhou, Jiadong; Zhou, Xuehong; Wang, Cong; Yao, Jingwen; Zhao, Ruiyang; Hu, Dehua; Qiao, Xianfeng; Ma, Dongge; Ma, Yuguang |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2019 |
| Journal volume | 11 |
| Journal issue | 34 |
| Pages of publication | 31139 - 31146 |
| a | 9.554 ± 0.0001 Å |
| b | 26.8344 ± 0.0003 Å |
| c | 32.851 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 8422.2 ± 0.15 Å3 |
| Cell temperature | 282 ± 3 K |
| Ambient diffraction temperature | 282 ± 3 K |
| Number of distinct elements | 3 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.036 |
| Residual factor for significantly intense reflections | 0.0335 |
| Weighted residual factors for significantly intense reflections | 0.0859 |
| Weighted residual factors for all reflections included in the refinement | 0.0875 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4514590.html
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Users of the data should acknowledge the original authors of the
structural data.