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Information card for entry 4514794
Preview
| Coordinates | 4514794.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H36 Ir N O2 |
|---|---|
| Calculated formula | C32 H36 Ir N O2 |
| SMILES | [Ir]12345([O]=C(c6c1n(c1c6cccc1)C)C(C)(C)C)(c1oc6c(c1)cccc6)[c]1([c]5([c]4([c]3([c]21C)C)C)C)C |
| Title of publication | C2/C4 Regioselective Heteroarylation of Indoles by Tuning C‒H Metalation Modes |
| Authors of publication | Chen, Shuyou; Zhang, Min; Su, Rongchuan; Chen, Xingyu; Feng, Boya; Yang, Yudong; You, Jingsong |
| Journal of publication | ACS Catalysis |
| Year of publication | 2019 |
| Journal volume | 9 |
| Journal issue | 7 |
| Pages of publication | 6372 |
| a | 11.5179 ± 0.0003 Å |
| b | 13.5428 ± 0.0006 Å |
| c | 18.483 ± 0.0006 Å |
| α | 76.588 ± 0.003° |
| β | 87.879 ± 0.002° |
| γ | 89.094 ± 0.003° |
| Cell volume | 2802.44 ± 0.17 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293.15 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0541 |
| Residual factor for significantly intense reflections | 0.0358 |
| Weighted residual factors for significantly intense reflections | 0.0669 |
| Weighted residual factors for all reflections included in the refinement | 0.0756 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4514794.html
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Users of the data should acknowledge the original authors of the
structural data.