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Information card for entry 4515327
Preview
| Coordinates | 4515327.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C39.5 H28 N6 O2 |
|---|---|
| Calculated formula | C39.5 H28 N6 O2 |
| Title of publication | Deep-Blue Oxadiazole-Containing Thermally Activated Delayed Fluorescence Emitters for Organic Light-Emitting Diodes. |
| Authors of publication | Wong, Michael Y.; Krotkus, Simonas; Copley, Graeme; Li, Wenbo; Murawski, Caroline; Hall, David; Hedley, Gordon J.; Jaricot, Marie; Cordes, David B.; Slawin, Alexandra M. Z.; Olivier, Yoann; Beljonne, David; Muccioli, Luca; Moral, Monica; Sancho-Garcia, Juan-Carlos; Gather, Malte C.; Samuel, Ifor D. W.; Zysman-Colman, Eli |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2018 |
| Journal volume | 10 |
| Journal issue | 39 |
| Pages of publication | 33360 - 33372 |
| a | 10.2355 ± 0.0011 Å |
| b | 10.7317 ± 0.0006 Å |
| c | 16.566 ± 0.002 Å |
| α | 72.138 ± 0.011° |
| β | 85.734 ± 0.013° |
| γ | 63.542 ± 0.009° |
| Cell volume | 1546.4 ± 0.3 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1246 |
| Residual factor for significantly intense reflections | 0.0657 |
| Weighted residual factors for significantly intense reflections | 0.1495 |
| Weighted residual factors for all reflections included in the refinement | 0.1737 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.938 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4515327.html
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Users of the data should acknowledge the original authors of the
structural data.