Information card for entry 4515393
| Formula |
C36 H34 B N O |
| Calculated formula |
C36 H34 B N O |
| SMILES |
B(c1ccc(N2c3c(Oc4c2cccc4)cccc3)cc1)(c1c(cc(cc1C)C)C)c1c(cc(cc1C)C)C |
| Title of publication |
Optically Triggered Planarization of Boryl-Substituted Phenoxazine: Another Horizon of TADF Molecules and High-Performance OLEDs. |
| Authors of publication |
Chen, Deng-Gao; Lin, Tzu-Chieh; Chen, Chi-Lin; Chen, Yi-Ting; Chen, Yi-An; Lee, Gene-Hsiang; Chou, Pi-Tai; Liao, Chia-Wei; Chiu, Po-Chen; Chang, Chih-Hao; Lien, Yi-Jyun; Chi, Yun |
| Journal of publication |
ACS applied materials & interfaces |
| Year of publication |
2018 |
| Journal volume |
10 |
| Journal issue |
15 |
| Pages of publication |
12886 - 12896 |
| a |
13.1953 ± 0.0002 Å |
| b |
13.2886 ± 0.0002 Å |
| c |
16.2248 ± 0.0003 Å |
| α |
90° |
| β |
103.28 ± 0.0005° |
| γ |
90° |
| Cell volume |
2768.9 ± 0.08 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0494 |
| Residual factor for significantly intense reflections |
0.0441 |
| Weighted residual factors for significantly intense reflections |
0.1132 |
| Weighted residual factors for all reflections included in the refinement |
0.1178 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.032 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4515393.html