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Information card for entry 4515924
Preview
| Coordinates | 4515924.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H18 Cu N2 O10 |
|---|---|
| Calculated formula | C20 H18 Cu N2 O10 |
| Title of publication | Enhanced Photosensitive Schottky Diode Behavior of Pyrazine over 2-Aminopyrimidine Ligand in Copper(II)-Phthalate MOFs: Experimental and Theoretical Rationalization. |
| Authors of publication | Hossain, Anowar; Dey, Arka; Seth, Saikat Kumar; Ray, Partha Pratim; Ballester, Pablo; Pritchard, Robin G.; Ortega-Castro, Joaquín; Frontera, Antonio; Mukhopadhyay, Subrata |
| Journal of publication | ACS omega |
| Year of publication | 2018 |
| Journal volume | 3 |
| Journal issue | 8 |
| Pages of publication | 9160 - 9171 |
| a | 16.9098 ± 0.001 Å |
| b | 11.4225 ± 0.0007 Å |
| c | 10.4825 ± 0.0007 Å |
| α | 90° |
| β | 95.3601 ± 0.0017° |
| γ | 90° |
| Cell volume | 2015.9 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0362 |
| Residual factor for significantly intense reflections | 0.0315 |
| Weighted residual factors for significantly intense reflections | 0.0791 |
| Weighted residual factors for all reflections included in the refinement | 0.0811 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4515924.html
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Users of the data should acknowledge the original authors of the
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