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Information card for entry 4516402
Preview
| Coordinates | 4516402.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C17 H15 N O4 |
|---|---|
| Calculated formula | C17 H15 N O4 |
| SMILES | O=C1N(C(=O)[C@@H]2[C@H]1[C@H]1C[C@@H]2C=C1)c1c(cc(cc1)C(=O)O)C |
| Title of publication | Correlation between Solid-State and Solution Conformational Ratios in a Series of N-(o-Tolyl)Succinimide Molecular Rotors |
| Authors of publication | Li, Ping; Hwang, Jungwun; Maier, Josef M.; Zhao, Chen; Kaborda, Darya V.; Smith, Mark D.; Pellechia, Perry J.; Shimizu, Ken D. |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2015 |
| Journal volume | 15 |
| Journal issue | 8 |
| Pages of publication | 3561 |
| a | 10.5608 ± 0.0008 Å |
| b | 6.4181 ± 0.0005 Å |
| c | 19.8406 ± 0.0014 Å |
| α | 90° |
| β | 90.419 ± 0.002° |
| γ | 90° |
| Cell volume | 1344.77 ± 0.17 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0567 |
| Residual factor for significantly intense reflections | 0.0455 |
| Weighted residual factors for significantly intense reflections | 0.1158 |
| Weighted residual factors for all reflections included in the refinement | 0.1217 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.064 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4516402.html
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Users of the data should acknowledge the original authors of the
structural data.