Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4516972
Preview
| Coordinates | 4516972.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C33 H27 Ir N2 O6 |
|---|---|
| Calculated formula | C33 H27 Ir N2 O6 |
| SMILES | c12c3ccc(OC(=O)C=C)c[n]3[Ir]34(c1cccc2)([O]=C(C=C(C)O4)C)c1c(c2ccc(OC(=O)C=C)c[n]32)cccc1 |
| Title of publication | Photoluminescence and Electrochemiluminescence Dual-Signaling Sensors for Selective Detection of Cysteine Based on Iridium(III) Complexes. |
| Authors of publication | Kim, Taemin; Hong, Jong-In |
| Journal of publication | ACS omega |
| Year of publication | 2019 |
| Journal volume | 4 |
| Journal issue | 7 |
| Pages of publication | 12616 - 12625 |
| a | 11.88223 ± 0.00007 Å |
| b | 15.04355 ± 0.0001 Å |
| c | 15.39444 ± 0.00008 Å |
| α | 90° |
| β | 90.6397 ± 0.0005° |
| γ | 90° |
| Cell volume | 2751.6 ± 0.03 Å3 |
| Cell temperature | 99.9 ± 0.9 K |
| Ambient diffraction temperature | 99.9 ± 0.9 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0153 |
| Residual factor for significantly intense reflections | 0.015 |
| Weighted residual factors for significantly intense reflections | 0.0384 |
| Weighted residual factors for all reflections included in the refinement | 0.0385 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.089 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4516972.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.