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Information card for entry 4518042
Preview
| Coordinates | 4518042.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C H6 I3 N Pb |
|---|---|
| Calculated formula | C H6 I3 N Pb |
| Title of publication | Incorporated Guanidinium Expands the CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> Lattice and Enhances Photovoltaic Performance. |
| Authors of publication | Gao, Lili; Li, Xiaotong; Liu, Yan; Fang, Junjie; Huang, Sheng; Spanopoulos, Ioannis; Li, Xiaolei; Wang, Yao; Chen, Lin; Yang, Guanjun; Kanatzidis, Mercouri G. |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2020 |
| Journal volume | 12 |
| Journal issue | 39 |
| Pages of publication | 43885 - 43891 |
| a | 8.8921 ± 0.0013 Å |
| b | 8.8921 ± 0.0013 Å |
| c | 12.604 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 996.6 ± 0.3 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 108 |
| Hermann-Mauguin space group symbol | I 4 c m |
| Hall space group symbol | I 4 -2c |
| Residual factor for all reflections | 0.1199 |
| Residual factor for significantly intense reflections | 0.1091 |
| Weighted residual factors for significantly intense reflections | 0.126 |
| Weighted residual factors for all reflections included in the refinement | 0.1263 |
| Goodness-of-fit parameter for significantly intense reflections | 7.55 |
| Goodness-of-fit parameter for all reflections included in the refinement | 7.05 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71359 Å |
| Diffraction radiation type | X-ray |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4518042.html
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Users of the data should acknowledge the original authors of the
structural data.