Information card for entry 4518136
| Formula |
C18 H15 N5 O2 S |
| Calculated formula |
C18 H15 N5 O2 S |
| SMILES |
s1c(nc(c2ccccc2)c1)N/N=C1/c2c(NCC1)c(N(=O)=O)ccc2 |
| Title of publication |
Novel Quinoline-Based Thiazole Derivatives for Selective Detection of Fe<sup>3+</sup>, Fe<sup>2+</sup>, and Cu<sup>2+</sup> Ions. |
| Authors of publication |
Shyamsivappan, Selvaraj; Saravanan, Arjunan; Vandana, Nandakumar; Suresh, Thangaraj; Suresh, Shanmugam; Nandhakumar, Raju; Mohan, Palathurai Subramaniam |
| Journal of publication |
ACS omega |
| Year of publication |
2020 |
| Journal volume |
5 |
| Journal issue |
42 |
| Pages of publication |
27245 - 27253 |
| a |
12.8882 ± 0.0012 Å |
| b |
16.8832 ± 0.0015 Å |
| c |
7.8668 ± 0.0007 Å |
| α |
90° |
| β |
106.261 ± 0.003° |
| γ |
90° |
| Cell volume |
1643.3 ± 0.3 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0579 |
| Residual factor for significantly intense reflections |
0.0425 |
| Weighted residual factors for significantly intense reflections |
0.1032 |
| Weighted residual factors for all reflections included in the refinement |
0.112 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.029 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4518136.html