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Information card for entry 4518753
Preview
| Coordinates | 4518753.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H30 O6 |
|---|---|
| Calculated formula | C30 H30 O6 |
| SMILES | O1C2(O[C@@H](OC2O[C@@H]1C(=O)c1c(cc(cc1)C)C)C(=O)c1c(cc(cc1)C)C)c1ccc(cc1C)C |
| Title of publication | Trifluoroacetic Acid-Mediated Oxidative Self-Condensation of Acetophenones in the Presence of SeO2: A Serendipitous Approach for the Synthesis of Fused [1,3]Dioxolo[4,5-d][1,3]dioxoles |
| Authors of publication | Marpna, Ibakyntiew D.; Shangpliang, O. Risuklang; Wanniang, Kmendashisha; Kshiar, Baskhemlang; Lipon, Tyrchain Mitre; Laloo, Badaker M.; Myrboh, Bekington |
| Journal of publication | ACS Omega |
| Year of publication | 2021 |
| a | 9.1302 ± 0.0006 Å |
| b | 11.5971 ± 0.001 Å |
| c | 12.5478 ± 0.0009 Å |
| α | 103.762 ± 0.007° |
| β | 96.584 ± 0.006° |
| γ | 90.048 ± 0.006° |
| Cell volume | 1281.41 ± 0.17 Å3 |
| Cell temperature | 293.55 ± 0.11 K |
| Ambient diffraction temperature | 293.55 ± 0.11 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0815 |
| Residual factor for significantly intense reflections | 0.0502 |
| Weighted residual factors for significantly intense reflections | 0.1147 |
| Weighted residual factors for all reflections included in the refinement | 0.1271 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4518753.html
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Users of the data should acknowledge the original authors of the
structural data.