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Information card for entry 4518842
Preview
| Coordinates | 4518842.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C21 H35 Cl N4 O3 Se Si2 |
|---|---|
| Calculated formula | C21 H35 Cl N4 O3 Se Si2 |
| SMILES | [Se]1C[C@H]2O[Si](O[Si](O[C@@H]2[C@@H]1n1cnc2ncnc(Cl)c12)(C(C)C)C(C)C)(C(C)C)C(C)C.[Se]1C[C@@H]2O[Si](O[Si](O[C@H]2[C@H]1n1cnc2ncnc(Cl)c12)(C(C)C)C(C)C)(C(C)C)C(C)C |
| Title of publication | Synthesis of 4-Selenothreofuranose Derivatives via Pummerer-Type Reactions of trans-3,4-Dioxygenated Tetrahydroselenophenes Mediated by a Selenonium Intermediate |
| Authors of publication | Iwaoka, Michio; Hiyoshi, Yuta; Arai, Shota; Ito, Takeru |
| Journal of publication | ACS Omega |
| Year of publication | 2021 |
| a | 22.866 ± 0.003 Å |
| b | 9.3514 ± 0.0007 Å |
| c | 25.515 ± 0.002 Å |
| α | 90° |
| β | 90.893 ± 0.009° |
| γ | 90° |
| Cell volume | 5455.2 ± 0.9 Å3 |
| Cell temperature | 103 K |
| Ambient diffraction temperature | 103 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1681 |
| Residual factor for significantly intense reflections | 0.0979 |
| Weighted residual factors for significantly intense reflections | 0.2429 |
| Weighted residual factors for all reflections included in the refinement | 0.2819 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4518842.html
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structural data.