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Information card for entry 4519255
Preview
| Coordinates | 4519255.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H22 O |
|---|---|
| Calculated formula | C24 H22 O |
| SMILES | O[C@H]([C@@H](c1cc2c(c3cc(ccc13)C)cccc2)c1ccccc1)C.O[C@@H]([C@H](c1cc2c(c3cc(ccc13)C)cccc2)c1ccccc1)C |
| Title of publication | Reactivity of Vinyl Epoxides/Oxetanes/Cyclopropanes toward Arynes: Access to Functionalized Phenanthrenes |
| Authors of publication | Liu, Jiupeng; Tang, Shuo; Zhao, Mengyao; Huai, Jianing; Yu, Jingya; Zhao, Jingjing; Li, Pan |
| Journal of publication | ACS Omega |
| Year of publication | 2021 |
| Journal volume | 6 |
| Journal issue | 51 |
| Pages of publication | 35852 - 35865 |
| a | 23.34 ± 0.02 Å |
| b | 9.228 ± 0.006 Å |
| c | 16.238 ± 0.011 Å |
| α | 90° |
| β | 92.475 ± 0.019° |
| γ | 90° |
| Cell volume | 3494 ± 4 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0935 |
| Residual factor for significantly intense reflections | 0.0779 |
| Weighted residual factors for significantly intense reflections | 0.203 |
| Weighted residual factors for all reflections included in the refinement | 0.2132 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.098 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4519255.html
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Users of the data should acknowledge the original authors of the
structural data.