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Information card for entry 4519265
Preview
| Coordinates | 4519265.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H34 Cl4 N2 O10 S4 |
|---|---|
| Calculated formula | C42 H34 Cl4 N2 O10 S4 |
| SMILES | S1C(SC(=C1c1ccc(C(=O)O)cc1)c1ccc(cc1)C(=O)O)=C1SC(=C(S1)c1ccc(cc1)C(=O)O)c1ccc(cc1)C(=O)O.ClCCl.ClCCl.O=CN(C)C.N(C=O)(C)C |
| Title of publication | An Electrically Conductive Tetrathiafulvalene-Based Hydrogen-Bonded Organic Framework |
| Authors of publication | Kirlikovali, Kent O.; Goswami, Subhadip; Mian, Mohammad Rasel; Krzyaniak, Matthew D.; Wasielewski, Michael R.; Hupp, Joseph T.; Li, Peng; Farha, Omar K. |
| Journal of publication | ACS Materials Letters |
| Year of publication | 2021 |
| Journal volume | 4 |
| Journal issue | 1 |
| Pages of publication | 128 - 135 |
| a | 10.1487 ± 0.0004 Å |
| b | 16.004 ± 0.0006 Å |
| c | 16.6748 ± 0.0007 Å |
| α | 78.442 ± 0.003° |
| β | 87.882 ± 0.003° |
| γ | 72.798 ± 0.004° |
| Cell volume | 2533.99 ± 0.18 Å3 |
| Cell temperature | 200.15 K |
| Ambient diffraction temperature | 200.15 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1828 |
| Residual factor for significantly intense reflections | 0.1721 |
| Weighted residual factors for significantly intense reflections | 0.4645 |
| Weighted residual factors for all reflections included in the refinement | 0.4711 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.168 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4519265.html
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Users of the data should acknowledge the original authors of the
structural data.