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Information card for entry 4519310
Preview
| Coordinates | 4519310.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | CQM |
|---|---|
| Formula | C34 H24 N2 |
| Calculated formula | C34 H24 N2 |
| SMILES | n1c(cc(c2ccccc2)c2c1c(n1c3ccccc3c3c1cccc3)ccc2C)c1ccccc1 |
| Title of publication | Molecular-Level Understanding of Dual-RTP via Host-Sensitized Multiple Triplet-to-Triplet Energy Transfers and Data Security Application |
| Authors of publication | Acharya, Nirmalya; Dey, Suvendu; Deka, Raktim; Ray, Debdas |
| Journal of publication | ACS Omega |
| Year of publication | 2022 |
| Journal volume | 7 |
| Journal issue | 4 |
| Pages of publication | 3722 - 3730 |
| a | 22.7897 ± 0.0016 Å |
| b | 11.5629 ± 0.0011 Å |
| c | 18.4891 ± 0.0013 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4872.2 ± 0.7 Å3 |
| Cell temperature | 297 ± 2 K |
| Ambient diffraction temperature | 297 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 56 |
| Hermann-Mauguin space group symbol | P c c n |
| Hall space group symbol | -P 2ab 2ac |
| Residual factor for all reflections | 0.073 |
| Residual factor for significantly intense reflections | 0.0398 |
| Weighted residual factors for significantly intense reflections | 0.0927 |
| Weighted residual factors for all reflections included in the refinement | 0.1137 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.021 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4519310.html
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