Information card for entry 7000263

Structure parameters

• Formula: C26 H48 N8 Si2 Sn
• Calculated formula: C26 H48 N8 Si2 Sn
• SMILES: [Sn](N=N#N)(N([Si](C)(C)C)[Si](C)(C)C)(c1c(N(C)C)cccc1N(C)C)c1c(N(C)C)cccc1N(C)C
• Title of publication: Synthesis and structures of halides and pseudohalides of bis[2,6-bis(dimethylamino)phenyl]tin(IV)
• Authors of publication: Hitchcock, Peter B.; Lappert, Michael F.; Protchenko, Andrey V.; Uiterweerd, Patrick G. H.
• Journal of publication: Dalton Transactions
• Year of publication: 2009
• Journal issue: 2
• Pages of publication: 353 - 361
• a: 9.5687 ± 0.0006 Å
• b: 17.0682 ± 0.0012 Å
• c: 11.0296 ± 0.0007 Å
• α: 90°
• β: 114.313 ± 0.004°
• γ: 90°
• Cell volume: 1641.6 ± 0.19 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 7
• Hermann-Mauguin space group symbol: P 1 n 1
• Hall space group symbol: P -2yac
• Residual factor for all reflections: 0.0314
• Residual factor for significantly intense reflections: 0.0295
• Weighted residual factors for significantly intense reflections: 0.0757
• Weighted residual factors for all reflections included in the refinement: 0.077
• Goodness-of-fit parameter for all reflections included in the refinement: 1.079
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No