Information card for entry 7000836

Structure parameters

• Common name: [{YbI(thf)(Me3SiNCPhCHCPhNSiMe3)}2]
• Formula: C50 H74 I2 N4 O2 Si4 Yb2
• Calculated formula: C50 H74 I2 N4 O2 Si4 Yb2
• SMILES: [O]1([Yb]23456([CH](=[C]2(c2ccccc2)N6[Si](C)(C)C)[C]4(c2ccccc2)=[N]5[Si](C)(C)C)[I][Yb]2456([I]3)([O]3CCCC3)[C](=[CH]2[C]4(=[N]6[Si](C)(C)C)c2ccccc2)(c2ccccc2)N5[Si](C)(C)C)CCCC1
• Title of publication: Heteroleptic ytterbium(ii) complexes supported by a bulky β-diketiminato ligand
• Authors of publication: Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Protchenko, Andrey V.
• Journal of publication: Dalton Transactions
• Year of publication: 2009
• Journal issue: 13
• Pages of publication: 2383 - 2391
• a: 15.0479 ± 0.0004 Å
• b: 15.8523 ± 0.0007 Å
• c: 12.3722 ± 0.0006 Å
• α: 90°
• β: 96.76 ± 0.003°
• γ: 90°
• Cell volume: 2930.8 ± 0.2 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.053
• Residual factor for significantly intense reflections: 0.0367
• Weighted residual factors for significantly intense reflections: 0.0833
• Weighted residual factors for all reflections included in the refinement: 0.0894
• Goodness-of-fit parameter for all reflections included in the refinement: 1.097
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No